Free Download Fundamentals of Bias Temperature Instability in MO… By Souvik Mahapatra (eds.) Publisher Springer India 2016 ISBN 978-81-322-2507-2,978-81-322-2508-9 Series Springer Series in Advanced Microelectronics 139 Edition 1 Pages XVI, 269/0

Code: 1408899

Title: Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling

Author: Souvik Mahapatra (eds.)

Edition: 1

Publisher: Springer India

Year: 2016

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Series: Springer Series in Advanced Microelectronics 139,

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Pages(biblio/tech): XVI, 269/0

Languages: English

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ISBN: 978-81-322-2507-2,978-81-322-2508-9

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DOI: 10.1007/978-81-322-2508-9

Google Id: Download eBook Fundamentals of Bias Temperature Instability in MOS Transistors: Characterizatio

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